Focused ion beam

Results: 158



#Item
11Electron microscopy / Electron microscope / Focused ion beam / Electron crystallography / Microscopy / Electron / Low-voltage electron microscope / Transmission electron microscopy

Joint Laboratory for Electron Microscopy Humboldt University Berlin & Leibniz Institute for Crystal Growth International Workshop “Facets of Electron Crystallography” Berlin, Germany

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Source URL: nanocrystallography.research.pdx.edu

Language: English - Date: 2012-07-14 13:09:39
12Electron microscopy / Microscopes / Spectroscopy / Microscopy / Electron beam / Electron microscope / Scanning electron microscope / Focused ion beam / Transmission electron microscopy / Scanning transmission electron microscopy / Electron microprobe / Raman microscope

Physical Electronics 5400 ESCA (XPS) (X-ray Photoelectron Spectroscopy) Elemental composition All elements except H and He Oxidation states

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Source URL: www.ampac.ucf.edu

Language: English - Date: 2013-11-15 16:05:43
13Materials science / Technology / Microtechnology / Chemistry / Semiconductor device fabrication / Emerging technologies / Microfabrication / Nanotechnology / Nanoimprint lithography / Microelectromechanical systems / Nanolithography / Focused ion beam

MNE2015 Scientific Program Tuesday Morning 22 September 1030

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Source URL: mne2015.org

Language: English - Date: 2015-09-09 05:30:57
14

Project Title: Project Short description Quantitative characterization by FIB/SEM “slice and view” The combination of Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) allows imaging the cross-sections fr

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Source URL: inl.int

Language: English - Date: 2014-09-12 11:07:07
    15

    Nuclear Solid State Physics Using Ion Beams The research activity of the Nuclear Solid State Physics Group is focused mainly in the processing and characterisation of advanced materials using ion beam based techniques. T

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    Source URL: www.itn.pt

    - Date: 2011-08-03 10:58:22
      16

      Microscopy: Science, Technology, Applications and Education A. Méndez-Vilas and J. Díaz (Eds.) ______________________________________________ Surface nanofabrication using focused ion beam

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      Source URL: www.formatex.info

      Language: English - Date: 2011-02-11 06:11:08
        17Neutron facilities / Nuclear physics / Ionizing radiation / Radioactivity / Radiobiology / Neutron scattering / Neutron / Ion beam / Open-pool Australian lightwater reactor / Physics / Particle physics / Scattering

        Physics Eduardo Alves The Physics Department focused its activities on Fundamental and Applied Research as well as Education and Training. The research groups in the sector have a long tradition of combining High level

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        Source URL: www.itn.pt

        Language: English - Date: 2005-05-07 05:37:52
        18Electron backscatter diffraction / Scanning electron microscope / Electron microscope / EDAX / Microscopy / Electron microprobe / Focused ion beam / Scientific method / Science / Electron microscopy

        Applied Scanning Electron Microscopy and Microanalysis (EDS and EBSD) Hands-on Five Week Short Course SEM: June 2, 9, and 16 EDS: June 23

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        Source URL: www.nanofab.utah.edu

        Language: English - Date: 2014-05-19 15:54:04
        19Scanning capacitance microscopy / Characterization / Electron microscope / Scanning probe microscopy / Failure analysis / Transmission electron microscopy / Focused ion beam / Scanning electron microscope / Energy-dispersive X-ray spectroscopy / Scientific method / Science / Electron microscopy

        FRAUNHOFER-INSTITUT FÜR I nte g rierte S y ste m e un d B aue l e m entete c hno l o g ie I I S B FAILURE ANALYSIS AND

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        Source URL: www.iisb.fraunhofer.de

        Language: English - Date: 2015-06-09 04:45:02
        20Science / Semiconductor device fabrication / Thin film deposition / Focused ion beam / Ion beam / Electron microscope / Transmission electron microscopy / Failure analysis / Fib / Scientific method / Physics / Electron microscopy

        Focused Ion Beam Services Nanostructuring, Failure Analysis, & Rapid IC-Prototyping FhG IISB supports you in processing nanosized structures and helps you to shorten time to market for your ASICs. Focused Ion Beam (FIB)

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        Source URL: www.iisb.fraunhofer.de

        Language: English - Date: 2015-06-08 13:41:23
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